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Information card for entry 4515151
Preview
| Coordinates | 4515151.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H18 Cu N6 O2 |
|---|---|
| Calculated formula | C24 H20 Cu N6 O2 |
| SMILES | [Cu]12([N](=NN(O1)c1ccccc1)c1ccccc1)ON(N=[N]2c1ccccc1)c1ccccc1 |
| Title of publication | Supramolecular Similarity in Polymorphs: Use of Similarity Indices (I<sup>X</sup>). |
| Authors of publication | Salbego, Paulo R. S.; Bender, Caroline R.; Orlando, Tainára; Moraes, Guilherme A.; Copetti, João P P; Weimer, Gustavo H.; Bonacorso, Helio G.; Zanatta, Nilo; Hoerner, Manfredo; Martins, Marcos A. P. |
| Journal of publication | ACS omega |
| Year of publication | 2019 |
| Journal volume | 4 |
| Journal issue | 6 |
| Pages of publication | 9697 - 9709 |
| a | 5.3076 ± 0.0002 Å |
| b | 22.0688 ± 0.0009 Å |
| c | 9.7098 ± 0.0004 Å |
| α | 90° |
| β | 103.682 ± 0.001° |
| γ | 90° |
| Cell volume | 1105.06 ± 0.08 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.1611 |
| Residual factor for significantly intense reflections | 0.0805 |
| Weighted residual factors for significantly intense reflections | 0.2029 |
| Weighted residual factors for all reflections included in the refinement | 0.2387 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.029 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4515151.html
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Users of the data should acknowledge the original authors of the
structural data.