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Information card for entry 4515337
Preview
Coordinates | 4515337.cif |
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Original paper (by DOI) | HTML |
Formula | C34 H27 F4 N3 Pt |
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Calculated formula | C34 H27 F4 N3 Pt |
SMILES | [Pt]123[n]4c(c5c2cc(F)cc5F)cccc4N(c2[n]1c(ccc2)c1c3cc(F)cc1F)c1ccc(cc1)CCCCCC |
Title of publication | Toward Tunable Electroluminescent Devices by Correlating Function and Submolecular Structure in 3D Crystals, 2D-Confined Monolayers, and Dimers. |
Authors of publication | Wilde, Sebastian; Ma, Dongxin; Koch, Tobias; Bakker, Anne; Gonzalez-Abradelo, Dario; Stegemann, Linda; Daniliuc, Constantin G.; Fuchs, Harald; Gao, Hongying; Doltsinis, Nikos L.; Duan, Lian; Strassert, Cristian A. |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2018 |
Journal volume | 10 |
Journal issue | 26 |
Pages of publication | 22460 - 22473 |
a | 10.9326 ± 0.0002 Å |
b | 11.3868 ± 0.0002 Å |
c | 12.5978 ± 0.0002 Å |
α | 67.259 ± 0.001° |
β | 87.877 ± 0.001° |
γ | 72.964 ± 0.001° |
Cell volume | 1377.71 ± 0.04 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0242 |
Residual factor for significantly intense reflections | 0.0238 |
Weighted residual factors for significantly intense reflections | 0.0614 |
Weighted residual factors for all reflections included in the refinement | 0.0619 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4515337.html
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Users of the data should acknowledge the original authors of the
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