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Information card for entry 4515338
Preview
Coordinates | 4515338.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H28 Cl4 N6 O11 Ru |
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Calculated formula | C36 H22 Cl4 N6 O8 Ru |
SMILES | c1cc(c2ccc3c(cc[n]4c3c2[n]1[Ru]124([n]3cccc4ccc5ccc[n]1c5c34)[n]1cccc3ccc4ccc[n]2c4c13)Cl)Cl.Cl(=O)(=O)(=O)[O-].Cl(=O)(=O)(=O)[O-] |
Title of publication | Aggregation-Induced Emission-Active Ruthenium(II) Complex of 4,7-Dichloro Phenanthroline for Selective Luminescent Detection and Ribosomal RNA Imaging. |
Authors of publication | Sheet, Sanjoy Kumar; Sen, Bhaskar; Patra, Sumit Kumar; Rabha, Monosh; Aguan, Kripamoy; Khatua, Snehadrinarayan |
Journal of publication | ACS applied materials & interfaces |
Year of publication | 2018 |
Journal volume | 10 |
Journal issue | 17 |
Pages of publication | 14356 - 14366 |
a | 13.186 ± 0.005 Å |
b | 16.978 ± 0.007 Å |
c | 18.115 ± 0.007 Å |
α | 90° |
β | 98.701 ± 0.013° |
γ | 90° |
Cell volume | 4009 ± 3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1344 |
Residual factor for significantly intense reflections | 0.0758 |
Weighted residual factors for significantly intense reflections | 0.202 |
Weighted residual factors for all reflections included in the refinement | 0.2369 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4515338.html
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