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Information card for entry 4516595
Preview
Coordinates | 4516595.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H28 N2 O4 S2 |
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Calculated formula | C24 H28 N2 O4 S2 |
SMILES | C1(=O)C(=O)c2c(cc(s2)c2cc3c(C(=O)C(=O)N3CCCCCC)s2)N1CCCCCC |
Title of publication | n-Type Organic Field-Effect Transistors Based on Bisthienoisatin Derivatives |
Authors of publication | Yoo, Dongho; Luo, Xuyi; Hasegawa, Tsukasa; Ashizawa, Minoru; Kawamoto, Tadashi; Masunaga, Hiroyasu; Ohta, Noboru; Matsumoto, Hidetoshi; Mei, Jianguo; Mori, Takehiko |
Journal of publication | ACS Applied Electronic Materials |
Year of publication | 2019 |
Journal volume | 1 |
Journal issue | 5 |
Pages of publication | 764 |
a | 33.028 ± 0.003 Å |
b | 5.02936 ± 0.00018 Å |
c | 14.9494 ± 0.0005 Å |
α | 90° |
β | 111.402 ± 0.003° |
γ | 90° |
Cell volume | 2312 ± 0.2 Å3 |
Cell temperature | 171 K |
Ambient diffraction temperature | 171 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0622 |
Residual factor for significantly intense reflections | 0.0562 |
Weighted residual factors for significantly intense reflections | 0.1505 |
Weighted residual factors for all reflections included in the refinement | 0.156 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.089 |
Diffraction radiation wavelength | 1.54187 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4516595.html
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