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Information card for entry 7000098
Preview
Coordinates | 7000098.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H67 N6 Ni P3 Si2 |
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Calculated formula | C32 H67 N6 Ni P3 Si2 |
SMILES | [Ni]12([P]3(N(C(C)(C)C)[Si](N3C(C)(C)C)(C)C)N2c2ccccc2N=P21N(C(C)(C)C)[Si](N2C(C)(C)C)(C)C)[P](CC)(CC)CC |
Title of publication | Reversal of polarization in amidophosphines: neutral- and anionic-kappaP coordination vs. anionic-kappaP,N coordination and the formation of nickelaazaphosphiranes. |
Authors of publication | Schranz, Ingo; Lief, Graham R.; Carrow, Christopher J.; Haagenson, Dana C.; Grocholl, Luke; Stahl, Lothar; Staples, Richard J.; Boomishankar, Ramamoorthy; Steiner, Alexander |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2005 |
Journal issue | 20 |
Pages of publication | 3307 - 3318 |
a | 11.4153 ± 0.0015 Å |
b | 12.2457 ± 0.0016 Å |
c | 16.145 ± 0.002 Å |
α | 79.259 ± 0.002° |
β | 79.351 ± 0.002° |
γ | 69.353 ± 0.002° |
Cell volume | 2057.4 ± 0.5 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0822 |
Residual factor for significantly intense reflections | 0.0505 |
Weighted residual factors for significantly intense reflections | 0.1213 |
Weighted residual factors for all reflections included in the refinement | 0.1297 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.946 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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