Information card for entry 7004805

Structure parameters

• Formula: C24 H56 N2 Ni P4 Se2 Te2
• Calculated formula: C24 H56 N2 Ni P4 Se2 Te2
• SMILES: N1=P(C(C)C)([Se][Ni]2([Te]=P(C(C)C)(C(C)C)N=P(C(C)C)(C(C)C)[Se]2)[Te]=P1(C(C)C)C(C)C)C(C)C
• Title of publication: Nickel(ii) complexes of heterodichalcogenido and monochalcogenido imidodiphosphinate ligands: AACVD synthesis of nickel ditelluride
• Authors of publication: Robertson, Stuart D.; Chivers, Tristram; Akhtar, Javeed; Afzaal, Mohammad; O'Brien, Paul
• Journal of publication: Dalton Transactions
• Year of publication: 2008
• Journal issue: 48
• Pages of publication: 7004 - 7011
• a: 9.7452 ± 0.0005 Å
• b: 9.7701 ± 0.0005 Å
• c: 9.9532 ± 0.0006 Å
• α: 82.164 ± 0.003°
• β: 89.853 ± 0.003°
• γ: 76.153 ± 0.003°
• Cell volume: 911.08 ± 0.09 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0331
• Residual factor for significantly intense reflections: 0.0271
• Weighted residual factors for significantly intense reflections: 0.0647
• Weighted residual factors for all reflections included in the refinement: 0.0678
• Goodness-of-fit parameter for all reflections included in the refinement: 1.038
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No