Information card for entry 7004806

Structure parameters

• Formula: C24 H56 N2 Ni P4 Se2
• Calculated formula: C24 H56 N2 Ni P4 Se2
• SMILES: N1[P](C(C)C)(C(C)C)[Ni]2([P](N=P(C(C)C)(C(C)C)[Se]2)(C(C)C)C(C)C)[Se]P=1(C(C)C)C(C)C
• Title of publication: Nickel(ii) complexes of heterodichalcogenido and monochalcogenido imidodiphosphinate ligands: AACVD synthesis of nickel ditelluride
• Authors of publication: Robertson, Stuart D.; Chivers, Tristram; Akhtar, Javeed; Afzaal, Mohammad; O'Brien, Paul
• Journal of publication: Dalton Transactions
• Year of publication: 2008
• Journal issue: 48
• Pages of publication: 7004 - 7011
• a: 8.9748 ± 0.0002 Å
• b: 19.7569 ± 0.0004 Å
• c: 9.3534 ± 0.0002 Å
• α: 90°
• β: 104.61 ± 0.03°
• γ: 90°
• Cell volume: 1604.9 ± 0.2 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0305
• Residual factor for significantly intense reflections: 0.0259
• Weighted residual factors for significantly intense reflections: 0.0711
• Weighted residual factors for all reflections included in the refinement: 0.0737
• Goodness-of-fit parameter for all reflections included in the refinement: 1.066
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No