Information card for entry 7006330

Structure parameters

• Common name: ((Na(AdCN)(N(SiMe3)(SiMe2Ph)))2)
• Formula: C44 H70 N4 Na2 Si4
• Calculated formula: C44 H70 N4 Na2 Si4
• SMILES: [Na]1([N]#CC23CC4CC(C3)CC(C2)C4)[N]([Si](C)(C)C)([Si](C)(C)c2ccccc2)[Na]([N]#CC23CC4CC(C3)CC(C2)C4)[N]1([Si](C)(C)C)[Si](C)(C)c1ccccc1
• Title of publication: Reactions between a sodium amide Na[N(SiMe3)R1] (R1 = SiMe3, SiMe2Ph or But) and a cyanoalkane RCN (R = Ad or Bu(t)).
• Authors of publication: Avent, Anthony G.; Antolini, Floria; Hitchcock, Peter B.; Khvostov, Alexei V.; Lappert, Michael F.; Protchenko, Andrey V.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2006
• Journal issue: 7
• Pages of publication: 919 - 927
• a: 10.3261 ± 0.0007 Å
• b: 11.118 ± 0.0012 Å
• c: 11.994 ± 0.001 Å
• α: 117.513 ± 0.004°
• β: 92.062 ± 0.005°
• γ: 100.72 ± 0.005°
• Cell volume: 1188.14 ± 0.19 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.095
• Residual factor for significantly intense reflections: 0.0741
• Weighted residual factors for significantly intense reflections: 0.1934
• Weighted residual factors for all reflections included in the refinement: 0.2046
• Goodness-of-fit parameter for all reflections included in the refinement: 1.155
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No