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Information card for entry 7006329
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Coordinates | 7006329.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | ((Na(N(SiMe3)2)(NCtBu))2) |
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Formula | C22 H54 N4 Na2 Si4 |
Calculated formula | C22 H54 N4 Na2 Si4 |
SMILES | C[Si](C)(C)[N]1([Si](C)(C)C)[Na]([N]#CC(C)(C)C)[N]([Si](C)(C)C)([Si](C)(C)C)[Na]1[N]#CC(C)(C)C |
Title of publication | Reactions between a sodium amide Na[N(SiMe3)R1] (R1 = SiMe3, SiMe2Ph or But) and a cyanoalkane RCN (R = Ad or Bu(t)). |
Authors of publication | Avent, Anthony G.; Antolini, Floria; Hitchcock, Peter B.; Khvostov, Alexei V.; Lappert, Michael F.; Protchenko, Andrey V. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2006 |
Journal issue | 7 |
Pages of publication | 919 - 927 |
a | 14.4173 ± 0.0005 Å |
b | 11.7327 ± 0.0003 Å |
c | 22.1248 ± 0.0005 Å |
α | 90° |
β | 106.847 ± 0.001° |
γ | 90° |
Cell volume | 3581.88 ± 0.18 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0976 |
Residual factor for significantly intense reflections | 0.0526 |
Weighted residual factors for significantly intense reflections | 0.1475 |
Weighted residual factors for all reflections included in the refinement | 0.1866 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.787 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7006329.html
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Users of the data should acknowledge the original authors of the
structural data.