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Information card for entry 7006842
Preview
Coordinates | 7006842.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | (Na(thf)6)(Na(thf)5)((Si(NCH2tBu)2C6H4)3) |
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Formula | C92 H166 N6 Na2 O11 Si3 |
Calculated formula | C92.04 H138 N6 Na2 O11 Si3 |
Title of publication | Insights into the making of a stable silylene. |
Authors of publication | Gehrhus, Barbara; Hitchcock, Peter B.; Pongtavornpinyo, Ruti; Zhang, Lihong |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2006 |
Journal issue | 15 |
Pages of publication | 1847 - 1857 |
a | 15.0722 ± 0.0001 Å |
b | 15.0722 ± 0.0001 Å |
c | 25.4341 ± 0.0003 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 5003.8 ± 0.08 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 176 |
Hermann-Mauguin space group symbol | P 63/m |
Hall space group symbol | -P 6c |
Residual factor for all reflections | 0.076 |
Residual factor for significantly intense reflections | 0.0671 |
Weighted residual factors for significantly intense reflections | 0.1858 |
Weighted residual factors for all reflections included in the refinement | 0.1932 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.085 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | Yes |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7006842.html
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