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Information card for entry 7008220
Preview
Coordinates | 7008220.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C38 H68 B10 O2 P4 Pt2 S |
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Calculated formula | C38 H68 B10 O2 P4 Pt2 S |
SMILES | [Pt]12345([Pt]678([P](C)(c9ccccc9)C)(S1(=O)=O)([P](c1ccccc1)(C)C)[BH]19%10[BH]%1136[BH]362[BH]2%12%13[BH]%14%15%16[BH]12([BH]9%116%13)[BH]7%10%15[BH]58%16[BH]43%12%14)([P](C)(c1ccccc1)C)[P](c1ccccc1)(C)C.CCCCCC |
Title of publication | The capture of dioxygen, carbon monoxide and sulfur dioxide by [(PMe2Ph)4Pt2B10H10]. |
Authors of publication | Bould, Jonathan; Kilner, Colin A.; Kennedy, John D. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2005 |
Journal issue | 9 |
Pages of publication | 1574 - 1582 |
a | 23.852 ± 0.0002 Å |
b | 10.848 ± 0.0001 Å |
c | 17.71 ± 0.0001 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4582.4 ± 0.06 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 7 |
Space group number | 33 |
Hermann-Mauguin space group symbol | P n a 21 |
Hall space group symbol | P 2c -2n |
Residual factor for all reflections | 0.0484 |
Residual factor for significantly intense reflections | 0.0471 |
Weighted residual factors for significantly intense reflections | 0.1266 |
Weighted residual factors for all reflections included in the refinement | 0.1284 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7008220.html
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