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Information card for entry 7008221
Preview
Coordinates | 7008221.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H54 B10 P4 Pt2 |
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Calculated formula | C32 H54 B10 P4 Pt2 |
SMILES | [BH]1234[Pt]56([P](C)(C)c7ccccc7)([P](C)(C)c7ccccc7)[BH]789[BH]%10%115[BH]526[BH]263[BH]3%121[BH]18([BH]89%11[BH]%1052[BH]6318)[Pt]47%12([P](C)(C)c1ccccc1)[P](C)(C)c1ccccc1 |
Title of publication | The capture of dioxygen, carbon monoxide and sulfur dioxide by [(PMe2Ph)4Pt2B10H10]. |
Authors of publication | Bould, Jonathan; Kilner, Colin A.; Kennedy, John D. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2005 |
Journal issue | 9 |
Pages of publication | 1574 - 1582 |
a | 17.164 ± 0.002 Å |
b | 11.3966 ± 0.0009 Å |
c | 20.0425 ± 0.0015 Å |
α | 90° |
β | 102.659 ± 0.002° |
γ | 90° |
Cell volume | 3825.2 ± 0.6 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 5 |
Space group number | 15 |
Hermann-Mauguin space group symbol | I 1 2/a 1 |
Hall space group symbol | -I 2ya |
Residual factor for all reflections | 0.019 |
Residual factor for significantly intense reflections | 0.0181 |
Weighted residual factors for significantly intense reflections | 0.0462 |
Weighted residual factors for all reflections included in the refinement | 0.0466 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.039 |
Diffraction radiation wavelength | 0.6933 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7008221.html
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