Information card for entry 7008376

Structure parameters

• Chemical name: bis((μ~2~-Sulfido)-(1,2-bis(diphenylarsino)ethane)-platinum) benzene solvate
• Formula: C64 H60 As4 Pt2 S2
• Calculated formula: C64 H60 As4 Pt2 S2
• SMILES: [Pt]12(S[Pt]3(S1)[As](CC[As]3(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)[As](CC[As]2(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1.c1ccccc1.c1ccccc1
• Title of publication: Influence of the terminal ligands on the redox properties of the {Pt2(mu-S)2} core in [Pt2(Ph2X(CH2)2XPh2)2(mu-S)2] (X = P or As) complexes and on their reactivity towards metal centres, protic acids and organic electrophiles.
• Authors of publication: Novio, Fernando; Mas-Ballesté, Rubén; Gallardo, Iluminada; González-Duarte, Pilar; Lledós, Agustí; Vila, Neus
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2005
• Journal issue: 16
• Pages of publication: 2742 - 2753
• a: 15.0056 ± 0.0016 Å
• b: 25.843 ± 0.003 Å
• c: 15.1951 ± 0.0017 Å
• α: 90°
• β: 96.204 ± 0.002°
• γ: 90°
• Cell volume: 5858 ± 1.1 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0959
• Residual factor for significantly intense reflections: 0.0384
• Weighted residual factors for significantly intense reflections: 0.0643
• Weighted residual factors for all reflections included in the refinement: 0.0826
• Goodness-of-fit parameter for all reflections included in the refinement: 1.094
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No