Information card for entry 7008733

Structure parameters

• Common name: [C6H4(NCH2tBu)2Si(Li(thf)2}{N(SiMe3)(C6H3Me2)}]
• Formula: C35 H60 Li N3 O2 Si2
• Calculated formula: C35 H60 Li N3 O2 Si2
• SMILES: [Li]([Si]1(N(c2c(N1CC(C)(C)C)cccc2)CC(C)(C)C)N([Si](C)(C)C)c1c(cccc1C)C)([O]1CCCC1)[O]1CCCC1
• Title of publication: Reaction of the stable silylene Si[(NCH2But)2C6H4-1,2] with lithium amides
• Authors of publication: Gehrhus, Barbara; Hitchcock, Peter B.; Parruci, Massimo
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2005
• Journal issue: 16
• Pages of publication: 2720 - 2725
• a: 18.2629 ± 0.001 Å
• b: 19.5814 ± 0.0007 Å
• c: 21.4761 ± 0.0011 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 7680.1 ± 0.6 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 6
• Space group number: 61
• Hermann-Mauguin space group symbol: P b c a
• Hall space group symbol: -P 2ac 2ab
• Residual factor for all reflections: 0.0902
• Residual factor for significantly intense reflections: 0.062
• Weighted residual factors for significantly intense reflections: 0.1607
• Weighted residual factors for all reflections included in the refinement: 0.1822
• Goodness-of-fit parameter for all reflections included in the refinement: 1.01
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No