Information card for entry 7008734

Structure parameters

• Common name: [C6H4(NCH2tBu)Si(SNMe2)Li(thf)3]
• Formula: C30 H56 Li N3 O3 Si
• Calculated formula: C30 H56 Li N3 O3 Si
• SMILES: [Li]([O]1CCCC1)([O]1CCCC1)([O]1CCCC1)[Si]1(N(c2c(N1CC(C)(C)C)cccc2)CC(C)(C)C)N(C)C
• Title of publication: Reaction of the stable silylene Si[(NCH2But)2C6H4-1,2] with lithium amides.
• Authors of publication: Gehrhus, Barbara; Hitchcock, Peter B.; Parruci, Massimo
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2005
• Journal issue: 16
• Pages of publication: 2720 - 2725
• a: 10.8302 ± 0.0005 Å
• b: 23.064 ± 0.0014 Å
• c: 13.7482 ± 0.0009 Å
• α: 90°
• β: 90.062 ± 0.004°
• γ: 90°
• Cell volume: 3434.1 ± 0.3 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.1171
• Residual factor for significantly intense reflections: 0.0778
• Weighted residual factors for significantly intense reflections: 0.1972
• Weighted residual factors for all reflections included in the refinement: 0.2229
• Goodness-of-fit parameter for all reflections included in the refinement: 1.04
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No