Information card for entry 7008772

Structure parameters

• Formula: C35 H58 Cl2 N4 Si2
• Calculated formula: C35 H58 Cl2 N4 Si2
• SMILES: [Si]1([Si]2(Cl)N(c3c(N2CC(C)(C)C)cccc3)CC(C)(C)C)(Cl)N(c2c(N(CC(C)(C)C)C1(C)C)cccc2)CC(C)(C)C
• Title of publication: Reactions of a stable silylene with halocarbons.
• Authors of publication: Delawar, Mahmood; Gehrhus, Barbara; Hitchcock, Peter B.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2005
• Journal issue: 17
• Pages of publication: 2945 - 2953
• a: 9.5407 ± 0.0003 Å
• b: 11.9325 ± 0.0004 Å
• c: 17.3185 ± 0.0005 Å
• α: 90.626 ± 0.002°
• β: 98.687 ± 0.002°
• γ: 104.831 ± 0.001°
• Cell volume: 1881.53 ± 0.1 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0713
• Residual factor for significantly intense reflections: 0.0466
• Weighted residual factors for significantly intense reflections: 0.1055
• Weighted residual factors for all reflections included in the refinement: 0.1176
• Goodness-of-fit parameter for all reflections included in the refinement: 1.035
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No