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Information card for entry 7009104
Preview
Coordinates | 7009104.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C68 H58 B Cu F4 N2 P4 S8 |
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Calculated formula | C68 H58 B Cu F4 N2 P4 S8 |
SMILES | [Cu]12([P](C3=C(SC(=C4SC(=C(S4)C)C)S3)[P]1(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)[P](C1=C(SC(S1)=C1SC(=C(S1)C)C)[P]2(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1.[B](F)(F)(F)[F-].CC#N.CC#N |
Title of publication | Homoleptic complexes of Ag(I), Cu(I), Pd(II) and Pt(II) with tetrathiafulvalene-functionalized phosphine ligands † |
Authors of publication | Smucker, Bradley W.; Dunbar, Kim R. |
Journal of publication | Journal of the Chemical Society, Dalton Transactions |
Year of publication | 2000 |
Journal issue | 8 |
Pages of publication | 1309 |
a | 17.788 ± 0.004 Å |
b | 20.676 ± 0.004 Å |
c | 18.183 ± 0.004 Å |
α | 90° |
β | 90.83 ± 0.03° |
γ | 90° |
Cell volume | 6687 ± 2 Å3 |
Cell temperature | 110 ± 2 K |
Ambient diffraction temperature | 110 ± 2 K |
Number of distinct elements | 8 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0938 |
Residual factor for significantly intense reflections | 0.0436 |
Weighted residual factors for significantly intense reflections | 0.0798 |
Weighted residual factors for all reflections included in the refinement | 0.0927 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.862 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7009104.html
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