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Information card for entry 7009922
Preview
| Coordinates | 7009922.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H24 Cr O10 |
|---|---|
| Calculated formula | C20 H24 Cr O10 |
| SMILES | [Cr]12345(C#[O])(C#[O])(C#[O])[c]6([cH]1[c]2([cH]3[c]4([cH]56)C(=O)O)C(=O)O)C(=O)O.CCCCOCCCC |
| Title of publication | Combining hydrogen bonds with coordination chemistry or organometallic π-arene chemistry: strategies for inorganic crystal engineering † |
| Authors of publication | Brammer, Lee; Rivas, Juan C. Mareque; Atencio, Reinaldo; Fang, Shiyue; Pigge, F. Christopher |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 2000 |
| Journal issue | 21 |
| Pages of publication | 3855 |
| a | 11.6029 ± 0.0003 Å |
| b | 13.0537 ± 0.0002 Å |
| c | 15.2638 ± 0.0002 Å |
| α | 87.472 ± 0.001° |
| β | 75.734 ± 0.001° |
| γ | 86.752 ± 0.001° |
| Cell volume | 2235.89 ± 0.07 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 5 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1643 |
| Residual factor for significantly intense reflections | 0.1101 |
| Weighted residual factors for all reflections | 0.3001 |
| Weighted residual factors for significantly intense reflections | 0.2674 |
| Goodness-of-fit parameter for all reflections | 1.145 |
| Goodness-of-fit parameter for significantly intense reflections | 1.328 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7009922.html
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Users of the data should acknowledge the original authors of the
structural data.