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Information card for entry 7011974
Preview
Coordinates | 7011974.cif |
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Original paper (by DOI) | HTML |
Formula | C31.5 H54 As6 Cl2 N0.5 O1.5 Ru |
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Calculated formula | C31.5 H54 As6 Cl2 N0.5 O1.5 Ru |
SMILES | [Ru]123([As](C)(C)c4ccccc4[As]1(C)C)([As](C)(C)c1ccccc1[As]2(C)C)[As](C)(C)c1ccccc1[As]3(C)C.[Cl-].[Cl-].O.O=CN(C)C |
Title of publication | Syntheses, characterization and redox properties of homoleptic ruthenium(II)‒diphosphine and diarsine complexes: deviations from ligand additivity |
Authors of publication | Annemarie A. La Pensée; Jamie Bickley; Simon J. Higgins; Massimo Marcaccio; Francesco Paolucci; Sergio Roffia; John M. Charnock |
Journal of publication | J. Chem. Soc., Dalton Trans. |
Year of publication | 2002 |
Journal issue | 22 |
Pages of publication | 4095 - 4104 |
a | 11.6861 ± 0.0016 Å |
b | 16.9 ± 0.002 Å |
c | 20.774 ± 0.003 Å |
α | 94.833 ± 0.017° |
β | 102.402 ± 0.016° |
γ | 92.756 ± 0.017° |
Cell volume | 3983.5 ± 1 Å3 |
Cell temperature | 213 ± 2 K |
Ambient diffraction temperature | 213 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0969 |
Residual factor for significantly intense reflections | 0.0481 |
Weighted residual factors for significantly intense reflections | 0.1016 |
Weighted residual factors for all reflections included in the refinement | 0.1122 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.837 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7011974.html
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