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Information card for entry 7011975
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Coordinates | 7011975.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H32 As2 F6 N4 O6 Ru S2 |
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Calculated formula | C32 H32 As2 F6 N4 O6 Ru S2 |
SMILES | [As]1(C)(C)c2ccccc2[As](C)(C)[Ru]231([n]1ccccc1c1cccc[n]21)[n]1ccccc1c1cccc[n]31.C(F)(F)(F)S(=O)(=O)[O-].C(F)(F)(F)S(=O)(=O)[O-] |
Title of publication | Syntheses, characterization and redox properties of homoleptic ruthenium(II)‒diphosphine and diarsine complexes: deviations from ligand additivity |
Authors of publication | Annemarie A. La Pensée; Jamie Bickley; Simon J. Higgins; Massimo Marcaccio; Francesco Paolucci; Sergio Roffia; John M. Charnock |
Journal of publication | J. Chem. Soc., Dalton Trans. |
Year of publication | 2002 |
Journal issue | 22 |
Pages of publication | 4095 - 4104 |
a | 19.422 ± 0.0014 Å |
b | 13.4406 ± 0.001 Å |
c | 28.171 ± 0.002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 7353.9 ± 0.9 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 8 |
Space group number | 61 |
Hermann-Mauguin space group symbol | P b c a |
Hall space group symbol | -P 2ac 2ab |
Residual factor for all reflections | 0.0266 |
Residual factor for significantly intense reflections | 0.024 |
Weighted residual factors for significantly intense reflections | 0.0598 |
Weighted residual factors for all reflections included in the refinement | 0.0607 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.082 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7011975.html
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