Information card for entry 7012282

Structure parameters

• Formula: C24 H76 Li4 N16 Si4
• Calculated formula: C24 H76 Li4 N16 Si4
• SMILES: [Li]123[N](C)(C)[Si](N(C)C)(N(C)C)[NH]1[Li]1[NH]45[Si](N(C)C)(N(C)C)[N](C)(C)[Li]46[N](C)(C)[Si](N(C)C)(N(C)C)[NH]6[Li]5[NH]12[Si](N(C)C)(N(C)C)[N]3(C)C
• Title of publication: Syntheses and structures of [(Me3N)3SiNHLi]4, (C4H8O)Al[NHSi(NMe2)3]3, ((Me2N)3SiNH)3Al and Li(THF)2+[((Me2N)3SiNH)4Al]‒
• Authors of publication: Bradley, John S.; Cheng, Fei; Archibald, Stephen J.; Supplit, Ralf; Rovai, Riccardo; Lehmann, Christian W.; Krüger, Carl; Lefebvre, Frédéric
• Journal of publication: Dalton Transactions
• Year of publication: 2003
• Journal issue: 9
• Pages of publication: 1846
• a: 11.567 ± 0.0005 Å
• b: 8.9071 ± 0.0008 Å
• c: 22.3754 ± 0.0016 Å
• α: 90°
• β: 96.861 ± 0.005°
• γ: 90°
• Cell volume: 2288.8 ± 0.3 ų
• Cell temperature: 293 K
• Ambient diffraction temperature: 293 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.1224
• Residual factor for significantly intense reflections: 0.0487
• Weighted residual factors for significantly intense reflections: 0.1429
• Weighted residual factors for all reflections included in the refinement: 0.1805
• Goodness-of-fit parameter for all reflections included in the refinement: 0.975
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No