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Information card for entry 7013879
Preview
Coordinates | 7013879.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | (Co(CO)3(P(N(iPr)2)(N(SiMe3)2))) |
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Formula | C15 H32 Co N2 O3 P Si2 |
Calculated formula | C15 H32 Co N2 O3 P Si2 |
SMILES | [Co](P(N(C(C)C)C(C)C)N([Si](C)(C)C)[Si](C)(C)C)(C#[O])(C#[O])C#[O] |
Title of publication | Synthesis and P-P cleavage reactions of [P(X)X']2; X-ray structures of [Co[P(X)X'](CO)3] and P4[P(X)X']2[X = N(SiMe3)2, X'= NPri2]. |
Authors of publication | Bezombes, Jean-Philippe; Hitchcock, Peter B.; Lappert, Michael F.; Nycz, Jacek E. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2004 |
Journal issue | 4 |
Pages of publication | 499 - 501 |
a | 9.719 ± 0.0006 Å |
b | 9.8945 ± 0.0007 Å |
c | 13.6614 ± 0.0012 Å |
α | 88.878 ± 0.004° |
β | 89.121 ± 0.004° |
γ | 61.153 ± 0.004° |
Cell volume | 1150.48 ± 0.15 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1011 |
Residual factor for significantly intense reflections | 0.0706 |
Weighted residual factors for significantly intense reflections | 0.1735 |
Weighted residual factors for all reflections included in the refinement | 0.1904 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.104 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7013879.html
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