Information card for entry 7015691

Structure parameters

• Formula: C24 H45 B F4 Ni O P2
• Calculated formula: C24 H45 B F4 Ni O P2
• SMILES: c12c3cccc1C[P](C(C)(C)C)(C(C)(C)C)[Ni]2([OH2])[P](C3)(C(C)(C)C)C(C)(C)C.[B](F)(F)(F)[F-]
• Title of publication: Nickel(II) hydride and fluoride pincer complexes and their reactivity with Lewis acids BX3·L (X = H, L = thf; X = F, L = Et2O).
• Authors of publication: Rossin, Andrea; Peruzzini, Maurizio; Zanobini, Fabrizio
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2011
• Journal volume: 40
• Journal issue: 17
• Pages of publication: 4447 - 4452
• a: 17.28 ± 0.008 Å
• b: 15.826 ± 0.007 Å
• c: 20.966 ± 0.009 Å
• α: 90 ± 0.005°
• β: 90 ± 0.005°
• γ: 90 ± 0.005°
• Cell volume: 5734 ± 4 ų
• Cell temperature: 123 ± 2 K
• Ambient diffraction temperature: 123 ± 2 K
• Number of distinct elements: 7
• Space group number: 61
• Hermann-Mauguin space group symbol: P b c a
• Hall space group symbol: -P 2ac 2ab
• Residual factor for all reflections: 0.0806
• Residual factor for significantly intense reflections: 0.0326
• Weighted residual factors for significantly intense reflections: 0.0465
• Weighted residual factors for all reflections included in the refinement: 0.0525
• Goodness-of-fit parameter for all reflections included in the refinement: 0.755
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71069 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No