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Information card for entry 7016188
Preview
Coordinates | 7016188.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C176 H256 Cl4 Li8 N44 Si16 Sn8 |
---|---|
Calculated formula | C176 H256 Cl4 Li8 N44 Si16 Sn8 |
SMILES | C[Si](C)(C)N([Si](C)(C)C)[Sn]1n2c3c(cccc3)[n]3[n]2[Li]24[Cl]56[Li]78[Cl][Sn](n9c%10c(cccc%10)[n]([Li]%106[n]6c%11c(cccc%11)n%11[n]6[Li]6([Cl]%12%13[Li]([n]%14c%15c(cccc%15)n1[n]2%14)([n]1c2c(cccc2)n2[n]1[Li]%13([Cl][Sn]2N([Si](C)(C)C)[Si](C)(C)C)[n]1c%13c(n%14[n]1[Li]1%12[n]2n(c%12c(cccc%12)[n]2[Li]25[n]5n(c%12c(cccc%12)[n]15)[Sn](N([Si](C)(C)C)[Si](C)(C)C)n1c5c(cccc5)[n]8[n]21)[Sn]%14N([Si](C)(C)C)[Si](C)(C)C)cccc%13)[n]1c2c(cccc2)n([n]41)[Sn]3N([Si](C)(C)C)[Si](C)(C)C)[n]1n(c2c(cccc2)[n]%101)[Sn](N([Si](C)(C)C)[Si](C)(C)C)n1c2c(cccc2)[n]([n]61)[Sn]%11N([Si](C)(C)C)[Si](C)(C)C)[n]79)N([Si](C)(C)C)[Si](C)(C)C.c1c(cccc1)C.c1c(cccc1)C.c1c(cccc1)C.c1c(cccc1)C.c1c(cccc1)C.c1c(cccc1)C.c1c(cccc1)C.c1c(cccc1)C |
Title of publication | Benzotriazolate cage complexes of tin(ii) and lithium: halide-influenced serendipitous assembly. |
Authors of publication | Sulway, Scott A.; Layfield, Richard A.; Bodensteiner, Michael; Scheuermayer, Sabine; Scheer, Manfred; Zabel, Manfred |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2011 |
Journal volume | 40 |
Journal issue | 29 |
Pages of publication | 7559 - 7563 |
a | 18.3637 ± 0.0006 Å |
b | 21.5801 ± 0.0006 Å |
c | 30.833 ± 0.0007 Å |
α | 93.165 ± 0.002° |
β | 98.775 ± 0.002° |
γ | 112.991 ± 0.003° |
Cell volume | 11027.7 ± 0.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0851 |
Residual factor for significantly intense reflections | 0.0443 |
Weighted residual factors for significantly intense reflections | 0.0856 |
Weighted residual factors for all reflections included in the refinement | 0.0944 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.971 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7016188.html
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