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Information card for entry 7021419
Preview
Coordinates | 7021419.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H39 Cl N2 O Si Sn |
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Calculated formula | C36 H39 Cl N2 O Si Sn |
SMILES | [Sn@@]1([N](Cc2c1cccc2)(C)C)(Cl)(O[Si](c1ccccc1)(c1ccccc1)c1ccccc1)c1c(cccc1)CN(C)C |
Title of publication | Activation of E-Cl bonds (E = C, Si, Ge and Sn) by a C,N-chelated stannylene. |
Authors of publication | Padělková, Zdeňka; Svec, Petr; Pejchal, Vladimír; Růžička, Aleš |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2013 |
Journal volume | 42 |
Journal issue | 21 |
Pages of publication | 7660 - 7671 |
a | 9.155 ± 0.0006 Å |
b | 9.4191 ± 0.0005 Å |
c | 11.4639 ± 0.0009 Å |
α | 66.266 ± 0.005° |
β | 79.64 ± 0.005° |
γ | 63.335 ± 0.004° |
Cell volume | 808.7 ± 0.1 Å3 |
Cell temperature | 150 ± 1 K |
Ambient diffraction temperature | 150 ± 1 K |
Number of distinct elements | 7 |
Space group number | 1 |
Hermann-Mauguin space group symbol | P 1 |
Hall space group symbol | P 1 |
Residual factor for all reflections | 0.0337 |
Residual factor for significantly intense reflections | 0.0329 |
Weighted residual factors for significantly intense reflections | 0.0802 |
Weighted residual factors for all reflections included in the refinement | 0.081 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.055 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7021419.html
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