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Information card for entry 7023134
Preview
| Coordinates | 7023134.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | In(S2CNCy2)3.2py |
|---|---|
| Formula | C49 H76 In N5 S6 |
| Calculated formula | C49 H76 In N5 S6 |
| Title of publication | Development of molecular precursors for deposition of indium sulphide thin film electrodes for photoelectrochemical applications. |
| Authors of publication | Ehsan, Muhammad Ali; Peiris, T. A. Nirmal; Wijayantha, K. G. Upul; Olmstead, Marilyn M.; Arifin, Zainudin; Mazhar, Muhammad; Lo, K. M.; McKee, Vickie |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2013 |
| Journal volume | 42 |
| Journal issue | 30 |
| Pages of publication | 10919 - 10928 |
| a | 10.5733 ± 0.0002 Å |
| b | 22.1491 ± 0.0006 Å |
| c | 22.3726 ± 0.0006 Å |
| α | 90° |
| β | 91.804 ± 0.002° |
| γ | 90° |
| Cell volume | 5236.8 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0769 |
| Residual factor for significantly intense reflections | 0.0476 |
| Weighted residual factors for significantly intense reflections | 0.0949 |
| Weighted residual factors for all reflections included in the refinement | 0.1055 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7023134.html
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