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Information card for entry 7024587
Preview
Coordinates | 7024587.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C242 H184 Ir16 O36 P12 |
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Calculated formula | C242 H184 Ir16 O36 P12 |
SMILES | [P]1([Ir]2345(C#[O])C(=O)[Ir]6783([P](c3ccccc3)(c3ccccc3)Cc3ccc(cc3)C[P]([Ir]39%10%11(C(=O)[Ir]%12%139([P](Cc9ccc(C[P]([Ir]%14%15%16%17(C#[O])C(=O)[Ir]%18%19%20%15([P](c%15ccccc%15)(c%15ccccc%15)Cc%15ccc(cc%15)C[P]([Ir]%15%21%22%23(C(=O)[Ir]%24%25%15([P](Cc%15ccc(C1)cc%15)(c1ccccc1)c1ccccc1)(C#[O])C(=O)[Ir]%23%25([Ir]%21%24(C#[O])(C#[O])C#[O])([P](Cc1ccc(C[P]([Ir]%16%19(C%14=O)(C%18=O)(C#[O])[Ir]%17%20(C#[O])(C#[O])C#[O])(c%14ccccc%14)c%14ccccc%14)cc1)(c1ccccc1)c1ccccc1)(C#[O])C%22=O)C#[O])(c1ccccc1)c1ccccc1)C#[O])(c1ccccc1)c1ccccc1)cc9)(c1ccccc1)c1ccccc1)(C#[O])C(=O)[Ir]%10%12([P](Cc1ccc(C[P]([Ir]47(C2=O)(C6=O)(C#[O])[Ir]58(C#[O])(C#[O])C#[O])(c2ccccc2)c2ccccc2)cc1)(c1ccccc1)c1ccccc1)(C#[O])(C3=O)[Ir]%11%13(C#[O])(C#[O])C#[O])C#[O])(c1ccccc1)c1ccccc1)C#[O])(c1ccccc1)c1ccccc1.c1(ccccc1)C.c1(ccccc1)C |
Title of publication | Four tetrairidium carbonyl clusters linked by six diphosphino ligands: synthesis and X-ray structure of [{Ir(4)(CO)(9)}(4)(dppmb)(6)] (dppmb = 1,4-bis(diphenylphosphinomethyl)benzene. |
Authors of publication | Peli, Giulia; Daghetta, Matteo; Macchi, Piero; Sironi, Angelo; Garlaschelli, Luigi |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2010 |
Journal volume | 39 |
Journal issue | 5 |
Pages of publication | 1188 - 1190 |
a | 18.8355 ± 0.0018 Å |
b | 14.9833 ± 0.0014 Å |
c | 49.076 ± 0.005 Å |
α | 90° |
β | 91.906 ± 0.001° |
γ | 90° |
Cell volume | 13842 ± 2 Å3 |
Cell temperature | 250 ± 2 K |
Ambient diffraction temperature | 250 ± 2 K |
Number of distinct elements | 5 |
Space group number | 13 |
Hermann-Mauguin space group symbol | P 1 2/c 1 |
Hall space group symbol | -P 2yc |
Residual factor for all reflections | 0.1846 |
Residual factor for significantly intense reflections | 0.0775 |
Weighted residual factors for significantly intense reflections | 0.1751 |
Weighted residual factors for all reflections included in the refinement | 0.2177 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.032 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7024587.html
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