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Information card for entry 7024588
Preview
Coordinates | 7024588.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C262 H200 Ir16 O36 P12 |
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Calculated formula | C262 H200 Ir16 O36 P12 |
SMILES | C(#[O])[Ir]12(C#[O])(C#[O])[Ir]3456(C(=O)[Ir]7815(C(=O)[Ir]268(C#[O])(C3=O)[P](c1ccccc1)(c1ccccc1)Cc1ccc(C[P](c2ccccc2)(c2ccccc2)[Ir]2356(C#[O])C(=O)[Ir]89%106(C(=O)[Ir]39(C2=O)(C#[O])([P](c2ccccc2)(Cc2ccc(cc2)C[P](c2ccccc2)(c2ccccc2)[Ir]2369(C(=O)[Ir]%11%123(C(=O)[Ir]9%12(C#[O])(C2=O)([P](Cc2ccc(cc2)C[P]8(c2ccccc2)c2ccccc2)(c2ccccc2)c2ccccc2)[Ir]6%11(C#[O])(C#[O])C#[O])(C#[O])[P](Cc2ccc(C[P](c3ccccc3)(c3ccccc3)[Ir]3689(C(=O)[Ir]%11%128(C(=O)[Ir]6%11(C#[O])(C3=O)([P](Cc3ccc(C[P]7(c6ccccc6)c6ccccc6)cc3)(c3ccccc3)c3ccccc3)[Ir]9%12(C#[O])(C#[O])C#[O])(C#[O])[P](Cc3ccc(C[P]4(c4ccccc4)c4ccccc4)cc3)(c3ccccc3)c3ccccc3)C#[O])cc2)(c2ccccc2)c2ccccc2)C#[O])c2ccccc2)[Ir]5%10(C#[O])(C#[O])C#[O])C#[O])cc1)C#[O])C#[O].c1(ccccc1)C.c1(ccccc1)C.c1ccccc1.c1ccccc1C.c1(ccccc1)C |
Title of publication | Four tetrairidium carbonyl clusters linked by six diphosphino ligands: synthesis and X-ray structure of [{Ir(4)(CO)(9)}(4)(dppmb)(6)] (dppmb = 1,4-bis(diphenylphosphinomethyl)benzene. |
Authors of publication | Peli, Giulia; Daghetta, Matteo; Macchi, Piero; Sironi, Angelo; Garlaschelli, Luigi |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2010 |
Journal volume | 39 |
Journal issue | 5 |
Pages of publication | 1188 - 1190 |
a | 14.829 ± 0.004 Å |
b | 18.483 ± 0.005 Å |
c | 48.91 ± 0.013 Å |
α | 91.942 ± 0.002° |
β | 91.431 ± 0.002° |
γ | 94.306 ± 0.002° |
Cell volume | 13355 ± 6 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1056 |
Residual factor for significantly intense reflections | 0.0735 |
Weighted residual factors for significantly intense reflections | 0.1764 |
Weighted residual factors for all reflections included in the refinement | 0.1941 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.062 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7024588.html
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