Information card for entry 7024622

Structure parameters

• Formula: C58 H40 Cu2 I2 O10 P2 Ru4 Te2
• Calculated formula: C58 H40 Cu2 I2 O10 P2 Ru4 Te2
• SMILES: C(#[O])[Ru]12345(C#[O])[Cu](I)[Ru]6782(C(=O)[Ru]29%106(C#[O])(C#[O])[Cu](I)[Ru]32(C1=O)(C#[O])(C#[O])([Te]479)[Te]58%10)(C#[O])C#[O].c1(ccccc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1.c1(ccccc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1
• Title of publication: Bimetallic Ru-Cu tellurido complexes: controlled synthesis and electrochemical studies of copper halide-TeRu(5) and Te(2)Ru(4) clusters.
• Authors of publication: Shieh, Minghuey; Chu, Yen-Yi; Miu, Chia-Yeh; Wu, Pei-Fan; Zeng, Tsau-Ming
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2010
• Journal volume: 39
• Journal issue: 6
• Pages of publication: 1492 - 1503
• a: 10.6181 ± 0.0003 Å
• b: 12.1029 ± 0.0003 Å
• c: 13.6619 ± 0.0005 Å
• α: 101.253 ± 0.001°
• β: 110.918 ± 0.001°
• γ: 98.297 ± 0.002°
• Cell volume: 1563.96 ± 0.08 ų
• Cell temperature: 298 ± 2 K
• Ambient diffraction temperature: 298 ± 2 K
• Number of distinct elements: 8
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0804
• Residual factor for significantly intense reflections: 0.0469
• Weighted residual factors for significantly intense reflections: 0.1031
• Weighted residual factors for all reflections included in the refinement: 0.1346
• Goodness-of-fit parameter for all reflections included in the refinement: 1.01
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No