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Information card for entry 7027909
Preview
| Coordinates | 7027909.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H74 Hg N4 Si6 |
|---|---|
| Calculated formula | C48 H74 Hg N4 Si6 |
| SMILES | [Hg]12(N([Si](C)(C)C)C(=[N]1C(=C([Si](C)(C)C)[Si](C)(C)C)c1ccccc1)c1ccccc1)N([Si](C)(C)C)C(=[N]2C(=C([Si](C)(C)C)[Si](C)(C)C)c1ccccc1)c1ccccc1 |
| Title of publication | Metal (Li, K, SnII and HgII) complexes of the 1,3-diazaallyl [N(R)C(Ph)NC(Ph)CR2]− (R = SiMe3) |
| Authors of publication | Hitchcock, Peter B.; Lappert, Michael F.; Layh, Marcus |
| Journal of publication | Journal of the Chemical Society, Dalton Transactions |
| Year of publication | 1998 |
| Journal issue | 18 |
| Pages of publication | 3113 |
| a | 12.995 ± 0.006 Å |
| b | 35.21 ± 0.015 Å |
| c | 13.391 ± 0.003 Å |
| α | 90° |
| β | 114.69 ± 0.02° |
| γ | 90° |
| Cell volume | 5567 ± 4 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.2029 |
| Residual factor for significantly intense reflections | 0.0797 |
| Weighted residual factors for all reflections | 0.1555 |
| Weighted residual factors for significantly intense reflections | 0.1142 |
| Goodness-of-fit parameter for all reflections | 1.009 |
| Goodness-of-fit parameter for significantly intense reflections | 1.136 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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