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Information card for entry 7027910
Preview
Coordinates | 7027910.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C48 H74 K2 N4 Si6 |
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Calculated formula | C48 H74 K2 N4 Si6 |
SMILES | [K]123[N]4([Si](C)(C)C)C(c5ccccc5)=[N]1(C(=C([Si](C)(C)C)[Si](C)(C)C)c1ccccc1)[K]14[N]2([Si](C)(C)C)C(c2ccccc2)=[N]13C(=C([Si](C)(C)C)[Si](C)(C)C)c1ccccc1 |
Title of publication | Metal (Li, K, SnII and HgII) complexes of the 1,3-diazaallyl [N(R)C(Ph)NC(Ph)CR2]− (R = SiMe3) |
Authors of publication | Hitchcock, Peter B.; Lappert, Michael F.; Layh, Marcus |
Journal of publication | Journal of the Chemical Society, Dalton Transactions |
Year of publication | 1998 |
Journal issue | 18 |
Pages of publication | 3113 |
a | 9.227 ± 0.003 Å |
b | 18.05 ± 0.008 Å |
c | 16.192 ± 0.011 Å |
α | 90° |
β | 96.09 ± 0.04° |
γ | 90° |
Cell volume | 2682 ± 2 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.09 |
Residual factor for significantly intense reflections | 0.0561 |
Weighted residual factors for all reflections | 0.1527 |
Weighted residual factors for significantly intense reflections | 0.1319 |
Goodness-of-fit parameter for all reflections | 1.043 |
Goodness-of-fit parameter for significantly intense reflections | 1.079 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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