Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7031426
Preview
Coordinates | 7031426.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H40 Ge4 N4 O6 S10 |
---|---|
Calculated formula | C24 H28 Ge4 N4 O6 S10 |
SMILES | c1cc(cc[n+]1C)c1cc[n+](C)cc1.O.O.O.[S-][Ge]12S[Ge]3([S-])S[Ge](S2)(S[Ge](S1)([S-])S3)[S-].c1cc(cc[n+]1C)c1cc[n+](cc1)C.O.O.O |
Title of publication | Ion pair charge-transfer thiogermanate salts [MV]2Ge4S10·xSol: solvent induced crystal transformation and photocurrent responsive properties. |
Authors of publication | Sun, Xiao-Lu; Zhu, Qin-Yu; Mu, Wen-Qin; Qian, Li-Wen; Yu, Lan; Wu, Jing; Bian, Guo-Qing; Dai, Jie |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2014 |
Journal volume | 43 |
Journal issue | 33 |
Pages of publication | 12582 - 12589 |
a | 9.2968 ± 0.0015 Å |
b | 21.035 ± 0.003 Å |
c | 21.516 ± 0.004 Å |
α | 90° |
β | 101.997 ± 0.005° |
γ | 90° |
Cell volume | 4115.7 ± 1.2 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1454 |
Residual factor for significantly intense reflections | 0.0876 |
Weighted residual factors for significantly intense reflections | 0.1293 |
Weighted residual factors for all reflections included in the refinement | 0.1465 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.184 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7031426.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.