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Information card for entry 7031427
Preview
Coordinates | 7031427.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C25 H32 Ge4 N4 O S10 |
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Calculated formula | C25 H32 Ge4 N4 O S10 |
SMILES | [Ge]12([S-])S[Ge]3([S-])S[Ge](S1)([S-])S[Ge](S2)(S3)[S-].[n+]1(ccc(cc1)c1cc[n+](cc1)C)C.[n+]1(ccc(cc1)c1cc[n+](cc1)C)C.CO |
Title of publication | Ion pair charge-transfer thiogermanate salts [MV]2Ge4S10·xSol: solvent induced crystal transformation and photocurrent responsive properties. |
Authors of publication | Sun, Xiao-Lu; Zhu, Qin-Yu; Mu, Wen-Qin; Qian, Li-Wen; Yu, Lan; Wu, Jing; Bian, Guo-Qing; Dai, Jie |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2014 |
Journal volume | 43 |
Journal issue | 33 |
Pages of publication | 12582 - 12589 |
a | 10.0424 ± 0.0008 Å |
b | 11.5726 ± 0.0012 Å |
c | 17.4356 ± 0.0018 Å |
α | 79.485 ± 0.014° |
β | 74.554 ± 0.013° |
γ | 74.835 ± 0.014° |
Cell volume | 1871.2 ± 0.4 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1332 |
Residual factor for significantly intense reflections | 0.0784 |
Weighted residual factors for significantly intense reflections | 0.1116 |
Weighted residual factors for all reflections included in the refinement | 0.1308 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.084 |
Diffraction radiation wavelength | 0.71075 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7031427.html
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Users of the data should acknowledge the original authors of the
structural data.