Information card for entry 7032495

Structure parameters

• Formula: C44 H76 N4 O2 S2 Si4 Sn2
• Calculated formula: C44 H76 N4 O2 S2 Si4 Sn2
• SMILES: c12cccc(c1c(ccc2)SCC(C)(C)[O]1[Sn](N([Si](C)(C)C)[Si](C)(C)C)[O](C(C)(C)CSc2cccc3cccc(c23)N(C)C)[Sn]1N([Si](C)(C)C)[Si](C)(C)C)N(C)C
• Title of publication: On the coordination chemistry of organochalcogenolates R(NMe2)^E(-) and R(NMe2)^E^O(-) (E = S, Se) onto lead(ii) and lighter divalent tetrel elements.
• Authors of publication: Pop, Alexandra; Wang, Lingfang; Dorcet, Vincent; Roisnel, Thierry; Carpentier, Jean-François; Silvestru, Anca; Sarazin, Yann
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2014
• Journal volume: 43
• Journal issue: 43
• Pages of publication: 16459 - 16474
• a: 15.6263 ± 0.0011 Å
• b: 8.4904 ± 0.0004 Å
• c: 21.1602 ± 0.0011 Å
• α: 90°
• β: 107.158 ± 0.003°
• γ: 90°
• Cell volume: 2682.5 ± 0.3 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0577
• Residual factor for significantly intense reflections: 0.0394
• Weighted residual factors for significantly intense reflections: 0.0693
• Weighted residual factors for all reflections included in the refinement: 0.0754
• Goodness-of-fit parameter for all reflections included in the refinement: 1.028
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No