Information card for entry 7032500

Structure parameters

• Formula: C24 H46 Ge N2 Se2 Si4
• Calculated formula: C24 H46 Ge N2 Se2 Si4
• SMILES: [Ge](N([Si](C)(C)C)[Si](C)(C)C)([Se]c1ccccc1)(N([Si](C)(C)C)[Si](C)(C)C)[Se]c1ccccc1
• Title of publication: On the coordination chemistry of organochalcogenolates R(NMe2)^E(-) and R(NMe2)^E^O(-) (E = S, Se) onto lead(ii) and lighter divalent tetrel elements.
• Authors of publication: Pop, Alexandra; Wang, Lingfang; Dorcet, Vincent; Roisnel, Thierry; Carpentier, Jean-François; Silvestru, Anca; Sarazin, Yann
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2014
• Journal volume: 43
• Journal issue: 43
• Pages of publication: 16459 - 16474
• a: 8.9113 ± 0.0004 Å
• b: 11.4671 ± 0.0004 Å
• c: 17.4235 ± 0.0006 Å
• α: 97.643 ± 0.001°
• β: 94.825 ± 0.002°
• γ: 112.152 ± 0.001°
• Cell volume: 1616.8 ± 0.11 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0553
• Residual factor for significantly intense reflections: 0.0404
• Weighted residual factors for significantly intense reflections: 0.0913
• Weighted residual factors for all reflections included in the refinement: 0.0961
• Goodness-of-fit parameter for all reflections included in the refinement: 1.033
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No