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Information card for entry 7032542
Preview
Coordinates | 7032542.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C20 H58 Eu N3 O2 Si6 |
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Calculated formula | C20 H58 Eu N3 O2 Si6 |
SMILES | [Eu](N([SiH](C)C)[SiH](C)C)(N([SiH](C)C)[SiH](C)C)(N([SiH](C)C)[SiH](C)C)([O]1CCCC1)[O]1CCCC1 |
Title of publication | Europium bis(dimethylsilyl)amides including mixed-valent Eu3[N(SiHMe2)2]6[μ-N(SiHMe2)2]2. |
Authors of publication | Bienfait, André M; Schädle, Christoph; Maichle-Mössmer, Cäcilia; Törnroos, Karl W; Anwander, Reiner |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2014 |
Journal volume | 43 |
Journal issue | 46 |
Pages of publication | 17324 - 17332 |
a | 13.0596 ± 0.0003 Å |
b | 16.3732 ± 0.0004 Å |
c | 16.6147 ± 0.0004 Å |
α | 90° |
β | 90.82 ± 0.01° |
γ | 90° |
Cell volume | 3552.31 ± 0.15 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0152 |
Residual factor for significantly intense reflections | 0.0144 |
Weighted residual factors for significantly intense reflections | 0.038 |
Weighted residual factors for all reflections included in the refinement | 0.0384 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.1 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7032542.html
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