Information card for entry 7032543

Structure parameters

• Formula: C32 H100 Eu3 N6 O2 Si12
• Calculated formula: C32 H100 Eu3 N6 O2 Si12
• SMILES: [Eu]1(N([SiH](C)C)[SiH](C)C)([O]2CCCC2)[N]([Eu]2([N]1([SiH](C)C)[SiH](C)C)[N]([Eu]([O]1CCCC1)([N]2([SiH](C)C)[SiH](C)C)N([SiH](C)C)[SiH](C)C)([SiH](C)C)[SiH](C)C)([SiH](C)C)[SiH](C)C
• Title of publication: Europium bis(dimethylsilyl)amides including mixed-valent Eu3[N(SiHMe2)2]6[μ-N(SiHMe2)2]2.
• Authors of publication: Bienfait, André M; Schädle, Christoph; Maichle-Mössmer, Cäcilia; Törnroos, Karl W; Anwander, Reiner
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2014
• Journal volume: 43
• Journal issue: 46
• Pages of publication: 17324 - 17332
• a: 15.3672 ± 0.0005 Å
• b: 39.2563 ± 0.0012 Å
• c: 32.0718 ± 0.001 Å
• α: 90°
• β: 90.434 ± 0.001°
• γ: 90°
• Cell volume: 19347.1 ± 1.1 ų
• Cell temperature: 103 ± 2 K
• Ambient diffraction temperature: 103 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0427
• Residual factor for significantly intense reflections: 0.0345
• Weighted residual factors for significantly intense reflections: 0.0585
• Weighted residual factors for all reflections included in the refinement: 0.0604
• Goodness-of-fit parameter for all reflections included in the refinement: 1.217
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No