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Information card for entry 7032544
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Coordinates | 7032544.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | ab182 |
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Formula | C16 H56 Eu N4 Na Si8 |
Calculated formula | C16 H56 Eu N4 Na Si8 |
SMILES | C[SiH](C)N([Eu](N([SiH](C)C)[SiH](C)C)(N([SiH](C)C)[SiH](C)C)N([SiH](C)C)[SiH](C)C)[SiH](C)C.[Na+] |
Title of publication | Europium bis(dimethylsilyl)amides including mixed-valent Eu3[N(SiHMe2)2]6[μ-N(SiHMe2)2]2. |
Authors of publication | Bienfait, André M; Schädle, Christoph; Maichle-Mössmer, Cäcilia; Törnroos, Karl W; Anwander, Reiner |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2014 |
Journal volume | 43 |
Journal issue | 46 |
Pages of publication | 17324 - 17332 |
a | 22.5076 ± 0.0014 Å |
b | 11.2473 ± 0.0009 Å |
c | 17.5201 ± 0.0011 Å |
α | 90° |
β | 124.589 ± 0.004° |
γ | 90° |
Cell volume | 3651.3 ± 0.5 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0377 |
Residual factor for significantly intense reflections | 0.0318 |
Weighted residual factors for significantly intense reflections | 0.0667 |
Weighted residual factors for all reflections included in the refinement | 0.0689 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.082 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7032544.html
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