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Information card for entry 7033137
Preview
| Coordinates | 7033137.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C35 H29 F6 N6 O2 P Ru |
|---|---|
| Calculated formula | C35 H29 F6 N6 O2 P Ru |
| Title of publication | Sticking and patching: tuning and anchoring cyclometallated ruthenium(II) complexes. |
| Authors of publication | Ertl, Cathrin D.; Ris, Daniel P.; Meier, Stefan C.; Constable, Edwin C.; Housecroft, Catherine E.; Neuburger, Markus; Zampese, Jennifer A. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2015 |
| Journal volume | 44 |
| Journal issue | 4 |
| Pages of publication | 1557 - 1570 |
| a | 10.6299 ± 0.001 Å |
| b | 13.1587 ± 0.0012 Å |
| c | 14.0271 ± 0.0013 Å |
| α | 82.634 ± 0.003° |
| β | 73.46 ± 0.003° |
| γ | 75.358 ± 0.003° |
| Cell volume | 1816.4 ± 0.3 Å3 |
| Cell temperature | 123 K |
| Ambient diffraction temperature | 123 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0377 |
| Residual factor for significantly intense reflections | 0.0376 |
| Weighted residual factors for all reflections | 0.0587 |
| Weighted residual factors for significantly intense reflections | 0.0576 |
| Weighted residual factors for all reflections included in the refinement | 0.0571 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.1954 |
| Diffraction radiation wavelength | 1.54178 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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