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Information card for entry 7033331
Preview
| Coordinates | 7033331.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H18 Cl2 N2 O Sn |
|---|---|
| Calculated formula | C26 H18 Cl2 N2 O Sn |
| SMILES | [Sn]12(Cl)(Cl)(Oc3c(C=[N]2c2c4[n]1cccc4ccc2)c1ccccc1cc3)c1ccccc1 |
| Title of publication | Sn(iv) Schiff base complexes: triplet photosensitizers for photoredox reactions. |
| Authors of publication | Grusenmeyer, Tod A.; King, Albert W.; Mague, Joel T.; Rack, Jeffrey J.; Schmehl, Russell H. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2014 |
| Journal volume | 43 |
| Journal issue | 47 |
| Pages of publication | 17754 - 17765 |
| a | 12.2999 ± 0.0015 Å |
| b | 10.4788 ± 0.0013 Å |
| c | 17.361 ± 0.002 Å |
| α | 90° |
| β | 90.753 ± 0.002° |
| γ | 90° |
| Cell volume | 2237.4 ± 0.5 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0393 |
| Residual factor for significantly intense reflections | 0.0288 |
| Weighted residual factors for significantly intense reflections | 0.0639 |
| Weighted residual factors for all reflections included in the refinement | 0.0696 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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