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Information card for entry 7033332
Preview
| Coordinates | 7033332.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H16 Cl2 N2 O Sn |
|---|---|
| Calculated formula | C22 H16 Cl2 N2 O Sn |
| SMILES | [Sn]12(Cl)(Cl)(Oc3ccccc3C=[N]1c1c3[n]2cccc3ccc1)c1ccccc1 |
| Title of publication | Sn(iv) Schiff base complexes: triplet photosensitizers for photoredox reactions. |
| Authors of publication | Grusenmeyer, Tod A.; King, Albert W.; Mague, Joel T.; Rack, Jeffrey J.; Schmehl, Russell H. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2014 |
| Journal volume | 43 |
| Journal issue | 47 |
| Pages of publication | 17754 - 17765 |
| a | 23.5629 ± 0.0005 Å |
| b | 11.2171 ± 0.0002 Å |
| c | 16.9265 ± 0.0003 Å |
| α | 90° |
| β | 90.415 ± 0.001° |
| γ | 90° |
| Cell volume | 4473.68 ± 0.15 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0286 |
| Residual factor for significantly intense reflections | 0.0243 |
| Weighted residual factors for significantly intense reflections | 0.0623 |
| Weighted residual factors for all reflections included in the refinement | 0.0643 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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