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Information card for entry 7033799
Preview
| Coordinates | 7033799.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H60 Ag2 N2 Si8 |
|---|---|
| Calculated formula | C22 H60 Ag2 N2 Si8 |
| SMILES | [Ag]1([Ag]([Si]1([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)[Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)[n]1cn(cc1)C |
| Title of publication | Synthesis, structural characterization and thermal properties of copper and silver silyl complexes. |
| Authors of publication | Sgro, Michael J.; Piers, Warren E.; Romero, Patricio E. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2015 |
| Journal volume | 44 |
| Journal issue | 8 |
| Pages of publication | 3817 - 3828 |
| a | 13.123 ± 0.0003 Å |
| b | 13.736 ± 0.0007 Å |
| c | 22.358 ± 0.0004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4030.2 ± 0.2 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P c 21 n |
| Hall space group symbol | P -2n -2ac |
| Residual factor for all reflections | 0.0681 |
| Residual factor for significantly intense reflections | 0.0556 |
| Weighted residual factors for significantly intense reflections | 0.1098 |
| Weighted residual factors for all reflections included in the refinement | 0.1175 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.16 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7033799.html
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