Information card for entry 7033800

Structure parameters

• Formula: C32 H74 Ag2 N4 Si8
• Calculated formula: C32 H74 Ag2 N4 Si8
• SMILES: [Ag]1([Ag]([Si]1([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)[Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)([n]1ccc(N(C)C)cc1)[n]1ccc(N(C)C)cc1
• Title of publication: Synthesis, structural characterization and thermal properties of copper and silver silyl complexes.
• Authors of publication: Sgro, Michael J.; Piers, Warren E.; Romero, Patricio E.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2015
• Journal volume: 44
• Journal issue: 8
• Pages of publication: 3817 - 3828
• a: 14.017 ± 0.0004 Å
• b: 21.779 ± 0.0005 Å
• c: 19.356 ± 0.0006 Å
• α: 90°
• β: 121.638 ± 0.0014°
• γ: 90°
• Cell volume: 5030.7 ± 0.3 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.102
• Residual factor for significantly intense reflections: 0.0683
• Weighted residual factors for significantly intense reflections: 0.1051
• Weighted residual factors for all reflections included in the refinement: 0.1159
• Goodness-of-fit parameter for all reflections included in the refinement: 1.195
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No