Information card for entry 7034645

Structure parameters

• Formula: C33 H55 N3 Si2 Zn
• Calculated formula: C33 H55 N3 Si2 Zn
• SMILES: [ZnH](N([Si](C)(C)C)[Si](C)(C)C)=C1N(C=CN1c1c(cccc1C(C)C)C(C)C)c1c(cccc1C(C)C)C(C)C
• Title of publication: Two alternative approaches to access mixed hydride-amido zinc complexes: synthetic, structural and solution implications.
• Authors of publication: Roberts, Andrew J.; Clegg, William; Kennedy, Alan R.; Probert, Michael R.; Robertson, Stuart D.; Hevia, Eva
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2015
• Journal volume: 44
• Journal issue: 17
• Pages of publication: 8169 - 8177
• a: 11.9943 ± 0.0005 Å
• b: 13.8275 ± 0.0005 Å
• c: 21.8642 ± 0.0008 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 3626.2 ± 0.2 ų
• Cell temperature: 123 ± 2 K
• Ambient diffraction temperature: 123 ± 2 K
• Number of distinct elements: 5
• Space group number: 19
• Hermann-Mauguin space group symbol: P 21 21 21
• Hall space group symbol: P 2ac 2ab
• Residual factor for all reflections: 0.0549
• Residual factor for significantly intense reflections: 0.0399
• Weighted residual factors for significantly intense reflections: 0.07
• Weighted residual factors for all reflections included in the refinement: 0.076
• Goodness-of-fit parameter for all reflections included in the refinement: 1.041
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No