Information card for entry 7034735

Structure parameters

• Formula: C36 H52 K2 N2 O4 Si4
• Calculated formula: C36 H52 K2 N2 O4 Si4
• SMILES: [K]123[O](c4c([Si]([N]2([Si](C)(C)c2c([O]1C)cccc2)[K]12[O](c5c([Si]([N]32[Si](C)(C)c2c([O]1C)cccc2)(C)C)cccc5)C)(C)C)cccc4)C
• Title of publication: Group 4 metal compounds incorporating the amide ligand, [N(SiMe2{C6H4-2-OMe})2](.).
• Authors of publication: Evans, Lloyd T. J.; Farnaby, Joy H.; Coles, Martyn P.; Cloke, F Geoffrey N; Hitchcock, Peter B.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2015
• Journal volume: 44
• Journal issue: 19
• Pages of publication: 8950 - 8958
• a: 12.8637 ± 0.0003 Å
• b: 8.4515 ± 0.0002 Å
• c: 19.6313 ± 0.0004 Å
• α: 90°
• β: 98.406 ± 0.001°
• γ: 90°
• Cell volume: 2111.34 ± 0.08 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 6
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0395
• Residual factor for significantly intense reflections: 0.0319
• Weighted residual factors for significantly intense reflections: 0.0797
• Weighted residual factors for all reflections included in the refinement: 0.0838
• Goodness-of-fit parameter for all reflections included in the refinement: 1.044
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No