Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 7034833
Preview
Coordinates | 7034833.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C22 H24 Cu Dy N5 O13 |
---|---|
Calculated formula | C22 H24 Cu Dy N5 O13 |
SMILES | [Dy]123456([O]7[Cu]89[O]1c1c(cccc1C=[N]8[C@H]1[C@H]([N]9=Cc%10c7c([O]2C)ccc%10)CCCC1)[O]3C)(ON(=[O]4)=O)([O]=N(=O)O5)[O]=N(=O)O6 |
Title of publication | Temperature-controlled polymorphism of chiral Cu(II)-Ln(III) dinuclear complexes exhibiting slow magnetic relaxation. |
Authors of publication | Wen, He-Rui; Bao, Jun; Liu, Sui-Jun; Liu, Cai-Ming; Zhang, Cai-Wei; Tang, Yun-Zhi |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2015 |
Journal volume | 44 |
Journal issue | 24 |
Pages of publication | 11191 - 11201 |
a | 11.2976 ± 0.0006 Å |
b | 15.2584 ± 0.0008 Å |
c | 15.8897 ± 0.0007 Å |
α | 90° |
β | 105.251 ± 0.003° |
γ | 90° |
Cell volume | 2642.7 ± 0.2 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 6 |
Space group number | 4 |
Hermann-Mauguin space group symbol | P 1 21 1 |
Hall space group symbol | P 2yb |
Residual factor for all reflections | 0.0751 |
Residual factor for significantly intense reflections | 0.0417 |
Weighted residual factors for significantly intense reflections | 0.0599 |
Weighted residual factors for all reflections included in the refinement | 0.0683 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.977 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7034833.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.