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Information card for entry 7035346
Preview
Coordinates | 7035346.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C29 H22 F16 N4 Ni2 O |
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Calculated formula | C29 H22 F16 N4 Ni2 O |
SMILES | [Ni]12([n]3c(c4[n]1cccc4)cccc3c1[n]([Ni]3([N]#CC)C(F)(F)C(F)(F)C(F)(F)C3(F)F)cccc1)C(F)(F)C(F)(F)C(F)(F)C2(F)F.O1CCCC1 |
Title of publication | Accessing perfluoroalkyl nickel(ii), (iii), and (iv) complexes bearing a readily attached [C4F8] ligand. |
Authors of publication | Yu, S.; Dudkina, Y.; Wang, H.; Kholin, K. V.; Kadirov, M. K.; Budnikova, Y. H.; Vicic, D. A. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2015 |
Journal volume | 44 |
Journal issue | 45 |
Pages of publication | 19443 - 19446 |
a | 10.262 ± 0.003 Å |
b | 11.987 ± 0.004 Å |
c | 13.409 ± 0.004 Å |
α | 98.828 ± 0.008° |
β | 104.504 ± 0.008° |
γ | 98.746 ± 0.008° |
Cell volume | 1546.4 ± 0.8 Å3 |
Cell temperature | 130 ± 2 K |
Ambient diffraction temperature | 130 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1114 |
Residual factor for significantly intense reflections | 0.0961 |
Weighted residual factors for significantly intense reflections | 0.2744 |
Weighted residual factors for all reflections included in the refinement | 0.2787 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.182 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7035346.html
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