Information card for entry 7035528
| Formula |
C9 H8 F15 N Si |
| Calculated formula |
C9 H8 F15 N Si |
| SMILES |
[Si](C(F)(F)C(F)(F)F)(C(F)(F)C(F)(F)F)(C(F)(F)C(F)(F)F)CN(C)C |
| Title of publication |
Pentafluoroethyl-substituted α-silanes: model compounds for new insights. |
| Authors of publication |
Waerder, Benedikt; Steinhauer, Simon; Bader, Julia; Neumann, Beate; Stammler, Hans-Georg; Vishnevskiy, Yury V.; Hoge, Berthold; Mitzel, Norbert W. |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2015 |
| Journal volume |
44 |
| Journal issue |
29 |
| Pages of publication |
13347 - 13358 |
| a |
7.6077 ± 0.0003 Å |
| b |
15.7881 ± 0.0007 Å |
| c |
12.7448 ± 0.0006 Å |
| α |
90° |
| β |
92.425 ± 0.004° |
| γ |
90° |
| Cell volume |
1529.42 ± 0.12 Å3 |
| Cell temperature |
100.01 ± 0.1 K |
| Ambient diffraction temperature |
100.01 ± 0.1 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0567 |
| Residual factor for significantly intense reflections |
0.0407 |
| Weighted residual factors for significantly intense reflections |
0.0944 |
| Weighted residual factors for all reflections included in the refinement |
0.104 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.095 |
| Diffraction radiation wavelength |
0.7107 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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