Information card for entry 7035529
| Formula |
C8 H6 F15 N O Si |
| Calculated formula |
C8 H6 F15 N O Si |
| Title of publication |
Pentafluoroethyl-substituted α-silanes: model compounds for new insights. |
| Authors of publication |
Waerder, Benedikt; Steinhauer, Simon; Bader, Julia; Neumann, Beate; Stammler, Hans-Georg; Vishnevskiy, Yury V.; Hoge, Berthold; Mitzel, Norbert W. |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2015 |
| Journal volume |
44 |
| Journal issue |
29 |
| Pages of publication |
13347 - 13358 |
| a |
8.0664 ± 0.0003 Å |
| b |
13.2774 ± 0.0013 Å |
| c |
14.999 ± 0.001 Å |
| α |
105.422 ± 0.007° |
| β |
91.66 ± 0.005° |
| γ |
104.381 ± 0.006° |
| Cell volume |
1492.3 ± 0.2 Å3 |
| Cell temperature |
150.01 ± 0.1 K |
| Ambient diffraction temperature |
150.01 ± 0.1 K |
| Number of distinct elements |
6 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.046 |
| Residual factor for significantly intense reflections |
0.0394 |
| Weighted residual factors for significantly intense reflections |
0.0925 |
| Weighted residual factors for all reflections included in the refinement |
0.0967 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.039 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
No |
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