Information card for entry 7038578
| Formula |
C32 H32 Cl4 Cu N4 O3 P S |
| Calculated formula |
C32 H32 Cl4 Cu N4 O3 P S |
| SMILES |
[Cu]12(OS(=O)(=O)c3c([P]1(c1ccccc1)c1ccccc1)cccc3)[n]1c(nc(cc1C)C)c1[n]2c(cc(n1)C)C.C(Cl)Cl.C(Cl)Cl |
| Title of publication |
Neutral copper(i) complexes featuring phosphinesulfonate chelates. |
| Authors of publication |
Vazart, F.; Savel, P.; Latouche, C.; Barone, V.; Camerel, F.; Roisnel, T.; Fillaut, J.-L.; Akdas-Kilig, H; Achard, M. |
| Journal of publication |
Dalton transactions (Cambridge, England : 2003) |
| Year of publication |
2016 |
| Journal volume |
45 |
| Journal issue |
15 |
| Pages of publication |
6566 - 6573 |
| a |
9.3556 ± 0.0003 Å |
| b |
12.7473 ± 0.0004 Å |
| c |
16.0649 ± 0.0005 Å |
| α |
72.391 ± 0.002° |
| β |
81.722 ± 0.001° |
| γ |
71.367 ± 0.001° |
| Cell volume |
1728.01 ± 0.1 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
8 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0498 |
| Residual factor for significantly intense reflections |
0.0377 |
| Weighted residual factors for significantly intense reflections |
0.0897 |
| Weighted residual factors for all reflections included in the refinement |
0.0963 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.041 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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