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Information card for entry 7038578
Preview
Coordinates | 7038578.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H32 Cl4 Cu N4 O3 P S |
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Calculated formula | C32 H32 Cl4 Cu N4 O3 P S |
SMILES | [Cu]12(OS(=O)(=O)c3c([P]1(c1ccccc1)c1ccccc1)cccc3)[n]1c(nc(cc1C)C)c1[n]2c(cc(n1)C)C.C(Cl)Cl.C(Cl)Cl |
Title of publication | Neutral copper(i) complexes featuring phosphinesulfonate chelates. |
Authors of publication | Vazart, F.; Savel, P.; Latouche, C.; Barone, V.; Camerel, F.; Roisnel, T.; Fillaut, J.-L.; Akdas-Kilig, H; Achard, M. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2016 |
Journal volume | 45 |
Journal issue | 15 |
Pages of publication | 6566 - 6573 |
a | 9.3556 ± 0.0003 Å |
b | 12.7473 ± 0.0004 Å |
c | 16.0649 ± 0.0005 Å |
α | 72.391 ± 0.002° |
β | 81.722 ± 0.001° |
γ | 71.367 ± 0.001° |
Cell volume | 1728.01 ± 0.1 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0498 |
Residual factor for significantly intense reflections | 0.0377 |
Weighted residual factors for significantly intense reflections | 0.0897 |
Weighted residual factors for all reflections included in the refinement | 0.0963 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.041 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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